Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer1 Scope This Technical Report describes a method for determining ion sputtering rates for depth profiling measurements with Auger electron spectroscopy (AES) and X ray photoelectron spectroscopy (XPS) where the specimen is ion sputtered over a region with an area between 0,4 mm2 and 3,0 mm2. This Technical Report is applicable only to a laterally homogeneous bulk or single layered material where the ion sputtering rate is determined from the sputtered

BS ISO 12129-2:2019 supersedes BS ISO 12129‑2:1995

The BS EN 4608 series discusses electrical cables for aerospace applications

The process approach enables an organization to plan its processes and their interactions

Harm caused by inadequate or improper maintenance

BS EN 60335-2-15 deals with the safety of electrical appliances for heating liquids for household and similar purposes

National Children’s Wear Association

NOTE Methods for testing other forms of foot and leg protection (e

ISO 20671 focuses on brand evaluation but considers this within a general framework that recognizes the relationship between brand evaluation and brand valuation

radiate unwanted fluidborne sound (airborne

Field test equipment is designed with two units that are attached to opposite ends of the cabling to be tested

Metallic coating manufacturers

Determination of dissolved anions by liquid chromatography of ions